Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy The Nexus system reliably ...
Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...
Electrochemical atomic force microscopy (EC-AFM) is a powerful analytical technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with electrochemical ...
This article introduces Park Systems' latest large-sample atomic force microscope (AFM), the FX200—engineered to support both foundational studies and advanced research applications. Designed for ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Park Systems’ latest atomic force ...
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